BaTi0.91(Hf0.5Zr0.5)0.09O3 thin films prepared by Nd3+:YAG (λ=266 Nm) laser ablation

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作者
Masuda, Y [1 ]
Fujita, S
Baba, A
Masumoto, H
Hirai, T
Nagata, K
机构
[1] Hachinohe Inst Technol, Fac Engn, Dept Elect Engn, Hachinohe, Aomori 031, Japan
[2] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 98077, Japan
[3] Natl Def Acad, Dept Elect Engn, Kanagawa 239, Japan
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中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We have demonstrated synthesis of BaTi(Hf0.5Zr0.5)O-3 (BTHZ) thin films using the fourth harmonic wave of a pulsed YAG (FHG-YAG) laser, for the first time. The BTHZ thin films with a preferred orientation in the c-axis are successfully synthesized and can be carried out under an oxygen gas pressure of 3 Pa at 800 degrees C. Crystallinity of the deposited films seems to depend on the distance between atoms of each element.
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页码:S1372 / S1374
页数:3
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