Six Degree of Freedom Vibration Isolation Platform for In-Line Nano-Metrology

被引:21
作者
Thier, Markus [1 ]
Saathof, Rudolf [1 ]
Sinn, Andreas [1 ]
Hainisch, Reinhard [1 ]
Schitter, Georg [1 ]
机构
[1] Vienna Univ Technol TU Vienna, Automat & Control Inst ACIN, Gusshausstr 27-29, A-1040 Vienna, Austria
关键词
Vibration isolation; Systems design; Nano-metrology; Precision positioning systems; DESIGN;
D O I
10.1016/j.ifacol.2016.10.534
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
A six degree of freedom, magnetically levitated metrology platform is proposed and implemented to enable nano-scale measurements directly in a production environment by providing vibration isolation. The metrology platform maintains a constant distance between sample and nano-metrology tool, forming a nano-scale laboratory environment directly in the production line. This paper presents the design of the proposed metrology platform. Tracking of the sample is achieved by using six position sensors, a six degree of freedom actuator and feedback control. Experimental results demonstrate positioning of the platform in six degrees of freedom at a bandwidth of 35 Hz in the translational directions and at a bandwidth of more than 15 Hz in the rotational directions, respectively. This results in a tracking error that is smaller than 50 nm rms. This paper denotes the first successful attempt for six degree of freedom vibration isolation to enable in-line nano-metrology. (C) 2016, IFAC (International Federation of Automatic Control) Hosting by Elsevier Ltd. All rights reserved.
引用
收藏
页码:149 / 156
页数:8
相关论文
共 9 条
[1]  
Deng R, 2014, P 22 INT C MAGN LEV
[2]  
Ito S, 2015, IEEE ASME INT C ADV, P470, DOI 10.1109/AIM.2015.7222578
[3]  
Leach R., 2014, Fundamental Principles of Engineering Nanometrology, V2nd
[4]   Digital lock-in detection for discriminating multiple modulation frequencies with high accuracy and computational efficiency [J].
Masciotti, James M. ;
Lasker, Joseph M. ;
Hiescher, Andreas H. .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2008, 57 (01) :182-189
[5]   Design and Modeling of a high-speed AFM-scanner [J].
Schitter, Georg ;
Astroem, Karl J. ;
DeMartini, Barry E. ;
Thurner, Philipp J. ;
Turner, Kimberly L. ;
Hansma, Paul K. .
IEEE TRANSACTIONS ON CONTROL SYSTEMS TECHNOLOGY, 2007, 15 (05) :906-915
[6]  
Schmidt RM, 2011, DESIGN OF HIGH PERFORMANCE MECHATRONICS: HIGH-TECH FUNCTIONALITY BY MULTIDISCIPLINARY SYSTEM INTEGRATION, P1, DOI 10.3233/978-1-60750-826-7-i
[7]  
Subrahmanyan P. K., 1999, THESIS
[8]   Design and control of a positioning system for robot-based nanometrology [J].
Thier, Markus ;
Saathof, Rudolf ;
Csencsics, Ernst ;
Hainisch, Reinhard ;
Sinn, Andreas ;
Schitter, Georg .
AT-AUTOMATISIERUNGSTECHNIK, 2015, 63 (09) :727-738
[9]  
van Eijk J., 2011, MICRONIEK, V51, P13