Characteristics of CdS films brush electrodeposited on low-temperature substrates

Cadmium sulfide films were deposited by the brush plating technique on titanium and conducting glass substrates using a current density of 80 mA cm(-2). X-ray diffraction studies indicated the polycrystalline nature of the films. As the deposition temperature decreased, the peaks were broad indicating the formation of nanocrystallites. Optical absorption measurements yielded band gap values in the range of 2.60-3.00 eV as the deposition temperature decreases. XPS studies confirmed the formation of CdS. Atomic force microscope studies indicated the roughness of the films decreases with decrease of deposition temperature. The films have exhibited photoresponse without any pre-heat treatment. (C) 2006 Elsevier Ltd. All rights reserved.