Harsh Environments: Space Radiation Environment, Effects, and Mitigation

被引：1

作者：

Maurer, Richard H. ^{[1
]}

Fraeman, Martin E.

Martin, Mark N. ^{[2
]}

Roth, David R. ^{[1
]}

机构：

[1] Johns Hopkins Univ, Appl Phys Lab, Dept Space, Laurel, MD 20703 USA

[2] Johns Hopkins Univ, Dept Comp Engn, Baltimore, MD 21218 USA

来源：

JOHNS HOPKINS APL TECHNICAL DIGEST | 2008年 / 28卷 / 01期

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Radiation effects in solid-state microelectronics can be split into two general categories: cumulative effects and single-event effects (SEEs). Cumulative effects produce gradual changes in the operational parameters of the devices, whereas SEEs cause abrupt changes or transient behavior in circuits. The space radiation environment provides a multitude of trapped, solar, and cosmic ray charged particles that cause such effects, interfere with space-system operation, and, in some cases, threaten the survival of such space systems. This article will describe these effects and how their impact may be mitigated in silicon-based microcircuits.

引用

页码：17 / 29

页数：13