A new method to measure monoclinic depth profile in zirconia-based ceramics from X-ray diffraction data

被引：21

作者：

Gremillard, Laurent ^{[1
]}

Grandjean, Sylvie ^{[1
]}

Chevalier, Jerome ^{[1
]}

机构：

[1] Univ Lyon, MATEIS, INSA Lyon, CNRS,UMR 5510, F-69621 Villeurbanne, France

来源：

INTERNATIONAL JOURNAL OF MATERIALS RESEARCH | 2010年 / 101卷 / 01期

关键词：

X-Ray Diffraction; Zirconia aging; PHASE;

D O I：

10.3139/146.110251

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

In this paper a method to evaluate monoclinic fraction depth profile in zirconia, based on X-ray diffraction at grazing angles, is proposed. The necessary mathematical developments are exposed. The method is numerically tested in different theoretical configurations, and then on zirconia-toughened alumina and on alumina-toughened zirconia. The results show that it is possible to follow both surface fraction and thickness of the monoclinic layer, within the penetration depth of the X-rays. This is a considerable improvement over simple X-ray diffraction measurements. However, its accuracy is limited for high depth, but considerably improved as compared to previous methods.

引用

页码：88 / 94

页数：7

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