Measurements of the Ion-Beam Current Distribution over a Target Surface under a High Bias Potential

被引：6

作者：

Mamedov, N. V. ^{[1
,2
]}

Prokhorovich, D. E. ^{[1
,2
]}

Yurkov, D. I. ^{[1
,2
]}

Kanshin, I. A. ^{[1
]}

Solodovnikov, A. A. ^{[1
]}

Kolodko, D. V. ^{[2
,3
]}

Sorokin, I. A. ^{[2
,3
]}

机构：

[1] Dukhov All Russia Res Inst Automat, Moscow 127055, Russia

[2] MEPHI Natl Res Nucl Univ, Moscow 115409, Russia

[3] Russian Acad Sci, Fryazino Branch, Kotelnikov Inst Radio Engn & Elect, Fryazino 141190, Moscow Oblast, Russia

来源：

INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 2018年 / 61卷 / 04期

关键词：

Compendex;

D O I：

10.1134/S0020441218030223

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A technique for direct measurements of the current distribution over the surface of a target that is at a negative bias potential relative to the ground was developed and tested. Measurements were performed using a six-channel meter that transmitted the measured data through a wireless Bluetooth acquisition system. The trace of an ion flow on the target surface was visualized by the method of luminous beams. Examples of the measured current distributions on a target surface depending on the geometric and physical parameters of the ion-optical system of a Penning plasma source are presented.

引用

页码：530 / 537

页数：8