Phase stabilization and microstructural studies of lead lanthanum titanate thin films

被引：1
作者：
Chopra, S
Sharma, S
Goel, TC [1 ]
Mendiratta, RG
机构：
[1] Indian Inst Technol, Dept Phys, Adv Ceram Lab, New Delhi 110016, India
[2] Netaji Subhas Inst Technol, New Delhi 110045, India
来源：
MATERIALS RESEARCH BULLETIN | 2005年 / 40卷 / 01期
关键词：
thin films; atomic force microscopy; X-ray diffraction;
D O I：
10.1016/j.materresbull.2004.09.014
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Thin ferroelectric films of PLTx (Pb1-xLaxTi1-x/O-4(3)) have been prepared by a sol-gel spin coating process. As deposited films were thermally treated for crystallization and formation of perovskite structure. Characterization of these films by X-ray diffraction (XRD) have been carried out for various concentrations of La (x = 0.04, 0.08 and 0.12) on ITO coated coming glass substrates. For a better understanding of the crystallization mechanism, the investigations were carried out on films annealed at temperatures (350, 450, 550 and 650 degreesC). Characterization of these films by X-ray diffraction shows that the films annealed at 650 degreesC exhibit tetragonal phase with perovskite structure. Atomic force microscope (AFM) images are characterized by slight surface roughness with a uniform crack free, densely packed structure. Fourier transform infrared spectra (FTIR) studies of PLTx thin films (x = 0.08) deposited on Si substrates have been carried out to get more information about the phase stabilization. (C) 2004 Elsevier Ltd. All rights reserved.
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页码：115 / 124
页数：10
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