Bent Bragg-Fresnel lenses for x-ray imaging diagnostics

被引：4

作者：

Aglitskiy, Y ^{[1
]}

Obenschain, S

Yunkin, V

机构：

[1] Sci Applicat Int Corp, Mclean, VA 22102 USA

[2] USN, Div Plasma Phys, Res Lab, Washington, DC 20375 USA

[3] Russian Acad Sci, Inst Microelect Technol, Chernogolovka 142432, Moscow Region, Russia

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2003年 / 74卷 / 03期

关键词：

D O I：

10.1063/1.1537859

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Bent Bragg-Fresnel lenses were tested under conditions relevant to the NRL Nike Laser monochromatic backlighting experiments. This hybrid two-dimensional (2D) x-ray imaging diagnostics incorporates high resolution and 1D focusing of the linear Fresnel structure as well as monochromatic and 1D focusing nature of cylindrically bent Bragg crystals. Lenses made of silicon (111) and quartz (10 (1) under bar1 and 10 (1) under bar0) with focal length of 125 rum were tested on our x-ray test bench. First images of backlit targets were obtained. Experimental issues, possible applications and future developments including extension of these diagnostics to the harder x rays (>10 keV), are discussed. (C) 2003 American Institute of Physics.

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页码：2228 / 2231

页数：4

相关论文

共 13 条

[1] Direct observation of mass oscillations due to ablative Richtmyer-Meshkov instability in plastic targets [J].

Aglitskiy, Y ;

Velikovich, AL ;

Karasik, M ;

Serlin, V ;

Pawley, CJ ;

Schmitt, AJ ;

Obenschain, SP ;

Mostovych, AN ;

Gardner, JH ;

Metzler, N .

PHYSICAL REVIEW LETTERS, 2001, 87 (26) :265001-1

[2] High-resolution monochromatic x-ray imaging system based on spherically bent crystals [J].

Aglitskiy, Y ;

Lehecka, T ;

Obenschain, S ;

Bodner, S ;

Pawley, C ;

Gerber, K ;

Sethian, J ;

Brown, CM ;

Seely, J ;

Feldman, U ;

Holland, G .

APPLIED OPTICS, 1998, 37 (22) :5253-5261

[3] SYNCHROTRON RADIATION FOCUSING BY A BRAGG-FRESNEL LENS [J].

ARISTOV, VV ;

BASOV, YA ;

SNIGIREV, AA .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (07) :1517-1518

[4] BRAGG ZONE PLATES FOR HARD X-RAY FOCUSING [J].

ARISTOV, VV ;

BASOV, YA ;

REDKIN, SV ;

SNIGIREV, AA ;

YUNKIN, VA .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1987, 261 (1-2) :72-74

[5]

ARISTOV VV, 1997, NUCL INSTRUM METH A, V385, P371

[6]

ARISTOVA E, 1995, XRAY MICROSCOPY, V4, P617

[7] Fabrication and characterization of III-V compound semiconductor Bragg-Fresnel lenses for hard X-ray microfocusing [J].

Caine, EJ ;

Shi, S ;

Hu, EL ;

Li, Y ;

Idziak, SHJ ;

Subramanian, G ;

Safinya, CR .

MICROELECTRONIC ENGINEERING, 1997, 35 (1-4) :289-292

[8] FIRST TEST OF THE SCANNING-X-RAY MICROPROBE WITH BRAGG-FRESNEL MULTILAYER LENS AT ESRF BEAM LINE [J].

CHEVALLIER, P ;

DHEZ, P ;

LEGRAND, F ;

IDIR, M ;

SOULLIE, G ;

MIRONE, A ;

ERKO, A ;

SNIGIREV, A ;

SNIGIREVA, I ;

SUVOROV, A ;

FREUND, A ;

ENGSTROM, P ;

NIELSEN, JA ;

GRUBEL, A .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1995, 354 (2-3) :584-587

[9] High-efficiency Bragg-Fresnel lenses with 100 nm outermost zone width [J].

David, C ;

Souvorov, A .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (11) :4168-4173

[10] MICROPLASMA OBJECT IMAGING SPECTROSCOPY BY USING ZONE-PLATE SURFACE-STRUCTURE ON MICA CRYSTAL [J].

ERKO, AI ;

PANCHENKO, LA ;

PIKUZ, SA ;

MINGALEEV, AR ;

ROMANOVA, VM ;

SHELKOVENKO, TA ;

FAENOV, AY ;

BRYUNETKIN, BA ;

PIKUZ, TA ;

SKOBELEV, IY .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (02) :1047-1049