Numerical Simulation of Critical Current Performance in Nb3Sn Strand Subjected to Periodic Bending Deformation

被引:1
作者
Murakami, Haruyuki [1 ]
Ueda, Hiroshi [1 ]
Ishiyama, Atsushi [1 ]
Koizumi, Norikiyo
Okuno, Kiyoshi
机构
[1] Waseda Univ, Tokyo, Japan
关键词
CIC conductor; critical current; bending strain; degradation; Nb3Sn; N-VALUE; MODEL;
D O I
10.1002/eej.20923
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In the ITER Engineering Design Activity (EDA), four NB3Sn model coils were developed and successfully tested. However, it was revealed that the critical current of the conductor degraded with the increase of electromagnetic force. One of the explanations of this phenomenon is a strand bending caused by enormous electromagnetic force. The authors therefore developed a simulation code using the distributed circuit model to investigate dependency of the critical current performance on the periodic bending deformation. The simulation results were in good agreement with the experiments. The dependence of the critical current on the periodic transverse load, temperature, periodic load pitch, thickness of Ta barrier which prevents Cu stabilizer from being contaminated by Sn, twist pitch of the strand, and RRR of the bronze matrix was investigated using the developed code. The results showed that the critical current degraded less with decreasing the pitch of the transverse load and increasing the Ta barrier thickness. It suggests that the shorter cabling pitch and the larger bending stiffness prevent the critical current degradation. (C) 2010 Wiley Periodicals, Inc. Electr Eng Jpn, 171(3): 7-15, 2010; Published online in Wiley Inter Science (www.interscience.wiley.com). DOI 10.1002/eej.20923
引用
收藏
页码:7 / 15
页数:9
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