Observations on high-anisotropy single crystals using a combined Kerr/magnetic force microscope

被引：14

作者：

Rave, W

Zueco, E

Schafer, R

Hubert, A

机构：

[1] IFW Dresden, Inst Met Werkstoffe, D-01069 Dresden, Germany

[2] Univ Erlangen Nurnberg, Inst Werkstoffwissensch, D-91058 Erlangen, Germany

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1998年 / 177卷

关键词：

magnetic force microscopy; magnetic imaging; domains;

D O I：

10.1016/S0304-8853(97)00793-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A magnetic force sensor was integrated into the objective revolver of an optical polarization microscope. The instrument was tested on a wedge-shaped Co single crystal and on blanched NdFeB domains. The combination of force and Kerr microscopy on identical domains gives access to a new interpretation of MFM contrasts. Three contrast mechanisms ale proposed to interpret the observations. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：1474 / 1475

页数：2