Fracture strength and Young's modulus of ZnO nanowires

被引:123
|
作者
Hoffmann, S.
Oestlund, F.
Michler, J.
Fan, H. J.
Zacharias, M.
Christiansen, S. H.
Ballif, C.
机构
[1] EMPA Swiss Fed Labs Mat Testing & Res, CH-3602 Thun, Switzerland
[2] Max Planck Inst Microstruct Phys, D-06120 Halle, Germany
[3] Univ Halle Wittenberg, D-06109 Halle, Germany
[4] Univ Neuchatel, Inst Microtechnol, CH-2000 Neuchatel, Switzerland
关键词
D O I
10.1088/0957-4484/18/20/205503
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The fracture strength of ZnO nanowires vertically grown on sapphire substrates was measured in tensile and bending experiments. Nanowires with diameters between 60 and 310 nm and a typical length of 2 mu m were manipulated with an atomic force microscopy tip mounted on a nanomanipulator inside a scanning electron microscope. The fracture strain of ( 7.7 +/- 0.8)% measured in the bending test was found to be close to the theoretical limit of 10% and revealed a strength about twice as high as in the tensile test. From the tensile experiments, the Young's modulus could be measured to be within 30% of that of bulk ZnO, contrary to the lower values found in the literature.
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页数:5
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