Polarization contrast with an apertureless near-field optical microscope

被引：15

作者：

Adam, PM ^{[1
]}

Royer, P ^{[1
]}

Laddada, R ^{[1
]}

Bijeon, JL ^{[1
]}

机构：

[1] Univ Technol Troyes, Lab Nanotechnol & Instrumentat Opt, F-10010 Troyes, France

来源：

ULTRAMICROSCOPY | 1998年 / 71卷 / 1-4期

关键词：

SNOM; near-field optics; scanning probe microscopy; polarization;

D O I：

10.1016/S0304-3991(97)00091-0

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We report on an apertureless scanning near-field optical microscope operating in reflection mode and based on a commercial AFM. We discuss the optical origin of the near-field images of a test sample. We show that the optical images have a sharp contrast depending on the stale of polarization of the incident light. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：327 / 331

页数：5

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