Comparator Testing in a Flash A/D Converter

被引：0

作者：

Onete, Cristian E. ^{[1
]}

机构：

[1] NXP Semiconduct, NL-5656 AE Eindhoven, Netherlands

来源：

IEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGS | 2009年

关键词：

D O I：

10.1109/SOCCON.2009.5398068

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, a method of testing a flash A/D converter is presented. The flash A/D is first reconfigured as a Propagation Type A/D and it is tested afterwards. It is shown that the testing method is suitable for a fully automated use i.e. without the need of external devices.

引用

页码：165 / 168

页数：4