Probing of the internal damage morphology in multilayered high-temperature superconducting wires

被引:37
作者
Zhou, You-He [1 ,2 ]
Liu, Cong [1 ,2 ]
Shen, Lei [1 ,2 ]
Zhang, Xingyi [1 ,2 ]
机构
[1] Lanzhou Univ, Minist Educ China, Key Lab Mech Disaster & Environm Western China, Lanzhou, Gansu, Peoples R China
[2] Lanzhou Univ, Coll Civil Engn & Mech, Dept Mech & Engn Sci, Lanzhou, Gansu, Peoples R China
关键词
COATED CONDUCTORS; FLUX INSTABILITY; STRAIN;
D O I
10.1038/s41467-021-23487-0
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The second generation HTS wires have been used in many superconducting components of electrical engineering after they were fabricated. New challenge what we face to is how the damages occur in such wires with multi-layer structure under both mechanical and extreme environment, which also dominates their quality. In this work, a macroscale technique combined a real-time magneto-optical imaging with a cryogenic uniaxial-tensile loading system was established to investigate the damage behavior accompanied with magnetic flux evolution. Under a low speed of tensile strain, it was found that the local magnetic flux moves gradually to form intermittent multi-stack spindle penetrations, which corresponds to the cracks initiated from substrate and extend along both tape thickness and width directions, where the amorphous phases at the tip of cracks were also observed. The obtained results reveal the mechanism of damage formation and provide a potential orientation for improving mechanical quality of these wires. Damage that occurs in second generation high-temperature-superconducting wires is problematic. Here, the authors present real-time magnetic flux behaviour in these wires under tensile strain and reveal damage evolution, including the amorphous phase in the superconducting layer acting in crack blunting during tension
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页数:8
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共 33 条
[1]   Dynamics of the dendritic flux instability in YBa2Cu3O7-δ films [J].
Bolz, U ;
Biehler, B ;
Schmidt, D ;
Runge, BU ;
Leiderer, P .
EUROPHYSICS LETTERS, 2003, 64 (04) :517-523
[2]   Magnetic-field dependence of the reversible axial-strain effect in Y-Ba-Cu-O coated conductors [J].
Cheggour, N ;
Ekin, JW ;
Thieme, CLH .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2005, 15 (02) :3577-3580
[3]   Origin of high critical currents in YBa2Cu3O7-δ superconducting thin films [J].
Dam, B ;
Huijbregtse, JM ;
Klaassen, FC ;
van der Geest, RCF ;
Doornbos, G ;
Rector, JH ;
Testa, AM ;
Freisem, S ;
Martinez, JC ;
Stäuble-Pümpin, B ;
Griessen, R .
NATURE, 1999, 399 (6735) :439-442
[4]   Influence of nickel substrate grain structure on YBa2Cu3O7-x supercurrent connectivity in deformation-textured coated conductors [J].
Feldmann, DM ;
Reeves, JL ;
Polyanskii, AA ;
Kozlowski, G ;
Biggers, RR ;
Nekkanti, RM ;
Maartense, I ;
Tomsic, M ;
Barnes, P ;
Oberly, CE ;
Peterson, TL ;
Babcock, SE ;
Larbalestier, DC .
APPLIED PHYSICS LETTERS, 2000, 77 (18) :2906-2908
[5]   Woodstock of physics revisited [J].
Grant, PM .
NATURE, 1997, 386 (6621) :115-118
[6]   45.5-tesla direct-current magnetic field generated with a high-temperature superconducting magnet [J].
Hahn, Seungyong ;
Kim, Kwanglok ;
Kim, Kwangmin ;
Hu, Xinbo ;
Painter, Thomas ;
Dixon, Iain ;
Kim, Seokho ;
Bhattarai, Kabindra R. ;
Noguchi, So ;
Jaroszynski, Jan ;
Larbalestier, David C. .
NATURE, 2019, 570 (7762) :496-+
[7]   High-temperature-superconductor coated conductors: technical progress in Japan [J].
Iijima, Y ;
Matsumoto, K .
SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2000, 13 (01) :68-81
[8]   Magneto-optical studies of current distributions in high-Tc superconductors [J].
Jooss, C ;
Albrecht, J ;
Kuhn, H ;
Leonhardt, S ;
Kronmüller, H .
REPORTS ON PROGRESS IN PHYSICS, 2002, 65 (05) :651-788
[9]   High-performance high-Tc superconducting wires [J].
Kang, S ;
Goyal, A ;
Li, J ;
Gapud, AA ;
Martin, PM ;
Heatherly, L ;
Thompson, JR ;
Christen, DK ;
List, FA ;
Paranthaman, M ;
Lee, DF .
SCIENCE, 2006, 311 (5769) :1911-1914
[10]   MAGNETOOPTICAL INVESTIGATIONS OF SUPERCONDUCTORS [J].
KOBLISCHKA, MR ;
WIJNGAARDEN, RJ .
SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 1995, 8 (04) :199-213