Rheological microscopy: Local mechanical properties from microrheology

被引:174
作者
Chen, DT [1 ]
Weeks, ER
Crocker, JC
Islam, MF
Verma, R
Gruber, J
Levine, AJ
Lubensky, TC
Yodh, AG
机构
[1] Univ Penn, Dept Phys & Astron, Philadelphia, PA 19104 USA
[2] Emory Univ, Dept Phys, Atlanta, GA 30322 USA
[3] Univ Penn, Dept Chem & Biomol Engn, Philadelphia, PA 19104 USA
[4] Univ Massachusetts, Dept Phys, Amherst, MA 01003 USA
关键词
D O I
10.1103/PhysRevLett.90.108301
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We demonstrate how tracer microrheology methods can be extended to study submicron scale variations in the viscoelastic response of soft materials; in particular, a semidilute solution of lambda-DNA. The polymer concentration is depleted near the surfaces of the tracer particles, within a distance comparable to the polymer correlation length. The rheology of this microscopic layer alters the tracers' motion and can be precisely quantified using one- and two-point microrheology. Interestingly, we found this mechanically distinct layer to be twice as thick as the layer of depleted concentration, likely due to solvent drainage through the locally perturbed polymer structure.
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