Auger effect in high-resolution Ce 3d-edge resonant photoemission -: art. no. 155107

被引:12
作者
Cho, EJ [1 ]
Jung, RJ
Choi, BH
Oh, SJ
Iwasaki, T
Sekiyama, A
Imada, S
Suga, S
Muro, T
Park, JG
Kwon, YS
机构
[1] Chonnam Natl Univ, Dept Phys, Kwangju 500757, South Korea
[2] Seoul Natl Univ, Sch Phys, Seoul 151742, South Korea
[3] Seoul Natl Univ, Ctr Strongly Correlated Mat Res, Seoul 151742, South Korea
[4] Osaka Univ, Grad Sch Engn Sci, Dept Mat Phys, Osaka 5608531, Japan
[5] Japan Synchrotron Radiat Res Inst, Hyogo 6795198, Japan
[6] Sungkyunkwan Univ, Dept Phys, Suwon 440746, South Korea
关键词
D O I
10.1103/PhysRevB.67.155107
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The bulk-sensitive Ce 4f spectral weights of various Ce compounds including CeFe2, CeNi2, and CeSi2 were obtained with the resonant photoemission technique at the Ce 3d edge. We found that the line shapes change significantly with the small change of the incident photon energy. Detailed analysis showed that this phenomenon results primarily from the Auger transition between different multiplet states of the Ce (3d(5/2)) under bar 4f(2) (bar denotes a hole) electronic configuration in the intermediate state of the resonant process. This tells us that extra care should be taken for the choice of the resonant photon energy when extracting Ce 4f spectral weights from the Ce 3d-edge resonant photoemission spectra. The absorption energy corresponding to the lowest multiplet structure of the Ce (3d(5/2)) under bar 4f(2) configuration seems to be the logical choice to obtain genuine Ce 4f spectral weight from the Ce 3d resonant photoemission data.
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页数:6
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