Electrostatic potential due to a potential drop across a slit

被引：2

作者：

Noh, YC ^{[1
]}

Eom, HJ ^{[1
]}

机构：

[1] Korea Adv Inst Sci & Technol, Dept Elect Engn, Yusung Gu, Taejon 305701, South Korea

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1998年 / 46卷 / 04期

关键词：

electrostatic potential; Fourier transform; mode matching; slit;

D O I：

10.1109/22.664144

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The electrostatic potential and charge density due to a potential drop across a slit in a thick conducting plane are obtained in analytic closed form. The Fourier transform, mode matching, and superposition are used to represent the potential in the spectral domain. The residue calculus is applied to represent the potential distribution in converging series form. Numerical computations are performed to illustrate the charge-density distribution through a slit.

引用

页码：428 / 430

页数：3

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