A crosstalk sensor implementation for measuring interferences in digital CMOS VLSI circuits

被引：5
|
作者：
Sainz, JA [1 ]
Roca, M [1 ]
Muñoz, R [1 ]
Maiz, JA [1 ]
Aguado, LA [1 ]
机构：
[1] Univ Basque Country, UPV, EHU, EUITI,Elect & Telecommun Dept, Vitoria 01006, Spain
来源：
6TH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS | 2000年
关键词：
D O I：
10.1109/OLT.2000.856611
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
This paper presents an approach for measuring crosstalk interference in digital CMOS VLSI circuits. The crosstalk sensor has been implemented in 0.8 mu m AMS (Austria Mikro Systeme) technology and its design is based on NOR and NAND RS latches. The interference is produced by an up (down) transition in an affecting line. The crosstalk sensor is designed to measure crosslink interference amplitude produced by capacitive coupling between long metal lines. The sensor is programmable for measuring some ranges of crosstalk amplitude. The sensor design is based on the dynamic behaviour of basic NOR and NAND gates depending on the MOS transistor sizes.
引用
收藏
页码：45 / 51
页数：7
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