Validation of Geant4 atomic relaxation against the NIST physical reference data

被引：28

作者：

Guatelli, S. ^{[1
]}

Mantero, A. ^{[1
]}

Mascialino, B. ^{[1
]}

Pia, M. G. ^{[1
]}

Zampichelli, V. ^{[1
]}

机构：

[1] Ist Nazl Fis Nucl, Sezione Genova, I-16146 Genoa, Italy

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2007年 / 54卷 / 03期

关键词：

Auger electron; fluorescence; Geant4; Monte Carlo; simulation;

D O I：

10.1109/TNS.2007.894814

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The accuracy of the Geant4 component for the simulation of atomic relaxation has been evaluated against the experimental measurements of the NIST Standard Reference Data. The validation study concerns X-ray and Auger transition energies. The comparison of the simulated and experimental data with rigorous statistical methods demonstrates the excellent accuracy of the simulation of atomic de-excitation in Geant4.

引用

页码：594 / 603

页数：10

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