Electrical properties of YBa2Cu3O7-x films of various thicknesses

被引：0

作者：

Razumov, SV ^{[1
]}

Tumarkin, AV ^{[1
]}

机构：

[1] St Petersburg State Electrotech Univ, St Petersburg, Russia

来源：

TECHNICAL PHYSICS LETTERS | 2003年 / 29卷 / 02期

基金：

俄罗斯基础研究基金会;

关键词：

Film Thickness; Electrical Property; Sapphire; Critical Current Density; Sapphire Substrate;

D O I：

10.1134/1.1558736

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have studied the electrical properties of high-T-c superconductor YBa2Cu3O7 - x films obtained by the ion-plasma deposition technique on sapphire substrates. Dependences of the surface resistance and the critical current density on the film thickness are determined. (C) 2003 MAIK "Nauka / Interperiodica".

引用

页码：97 / 98

页数：2

共 5 条

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