Dependence of XLPE insulated power cable wave propagation characteristics on design parameters

被引:38
作者
Mugala, Gavita
Eriksson, Roland
Pettersson, Per
机构
[1] Royal Inst Technol, Dept Electromagnet Engn, S-10044 Stockholm, Sweden
[2] Vattenfall Res & Dev, Stockholm, Sweden
关键词
attenuation; dielectric; high frequency; insulation; phase velocity; propagation characteristics; semi-conducting screens; series impedance; shunt admittance;
D O I
10.1109/TDEI.2007.344619
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Propagation losses occur in medium voltage power cables as pulses propagate through them. Since cables have many components, these can make different contributions to the propagation losses. The relative contributions of the conductors, insulation and semi-conducting screens to the propagation characteristics of the cable are analyzed. The propagation characteristics of the cables are studied by a developed "approximate" model providing analytical expressions that can quantify the contributions to the losses by the different parts of the conductor and dielectric system. The model is compared with an "exact" model and is tested on four cables.
引用
收藏
页码:393 / 399
页数:7
相关论文
共 11 条
[1]   Semiconducting layer impedance and its effect on cable wave-propagation and transient characteristics [J].
Ametani, A ;
Miyamoto, Y ;
Nagaoka, N .
IEEE TRANSACTIONS ON POWER DELIVERY, 2004, 19 (04) :1523-1531
[2]  
[Anonymous], 1993, Fields and Waves in Communication Electronics
[3]   Partial discharge .22. High Frequency attenuation in shielded solid dielectric power cable and implications thereof for PD location [J].
Boggs, S ;
Pathak, A ;
Walker, P .
IEEE ELECTRICAL INSULATION MAGAZINE, 1996, 12 (01) :9-16
[4]  
Kaden H., 1959, WIRBELSTROME SCHIRMU
[5]  
Mugala G, 2004, IEEE T DIELECT EL IN, V11, P471
[6]  
Papazyan R, 2004, IEEE T DIELECT EL IN, V11, P461
[7]  
Shugg W. T., 1986, HDB ELECT ELECT INSU
[8]  
Stone G. C., 1982, P IEEE C EL INS DIEL, P275
[9]   WAVE-PROPAGATION CHARACTERISTICS IN UNDERGROUND POWER CABLE [J].
WEEKS, WL ;
DIAO, YM .
IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1984, 103 (10) :2816-2826
[10]   High frequency properties of shielded power cable part 2: Sources of error in measuring shield dielectric properties [J].
Xu, CC ;
Boggs, SA .
IEEE ELECTRICAL INSULATION MAGAZINE, 2006, 22 (01) :7-13