Grazing incidence X-ray diffraction study on surface crystal structure of polyethylene thin films

被引：33
|
作者：
Yakabe, H
Tanaka, K
Nagamura, T
Sasaki, S
Sakata, O
Takahara, A
Kajiyama, T [1 ]
机构：
[1] Kyushu Univ, Fukuoka 8128581, Japan
[2] Kyushu Univ, Fac Engn, Dept Appl Chem, Fukuoka 8128581, Japan
[3] Japan Synchrotron Radiat Res Inst, Sayo, Hyogo 6795198, Japan
[4] Kyushu Univ, Inst Mat Chem & Engn, Fukuoka 8128581, Japan
来源：
POLYMER BULLETIN | 2005年 / 53卷 / 03期
关键词：
D O I：
10.1007/s00289-004-0329-2
中图分类号：
O63 [高分子化学（高聚物）];
学科分类号：
070305 ; 080501 ; 081704 ;
摘要：
Crystal structure in thin films of melt-crystallized and annealed polyethylene (PE) was examined by grazing incidence X-ray diffraction measurements. Choosing appropriate incident angles of X-rays to the films, surface and bulk molecular aggregation states were successfully extracted. Consequently, it was found that chain packing structure in the surface region was different from that in the bulk one. Based on paracrystalline analysis for the (110) reflection and its higher-order ones of PE orthorhombic crystal, it was clarified that the ordering for the crystalline lattice was lower in the surface region. Also, apparent crystallinity in the surface was lower than the bulk one. These results indicate that disordered crystallites were preferentially formed in the surface region.
引用
收藏
页码：213 / 222
页数：10
相关论文
共 50 条
  • [1] Grazing Incidence X-ray Diffraction Study on Surface Crystal Structure of Polyethylene Thin Films
    Hirohiko Yakabe
    Keiji Tanaka
    Toshihiko Nagamura
    Sono Sasaki
    Osami Sakata
    Atsushi Takahara
    Tisato Kajiyama
    Polymer Bulletin, 2005, 53 : 213 - 222
  • [2] Grazing Incidence X-Ray Diffraction Study of Tantalum Thin Films
    Yunin P.A.
    Drozdov Y.N.
    Gusev N.S.
    Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 2018, 12 (4) : 701 - 704
  • [3] Crystal structure of oligothiophene thin films characterized by two-dimensional grazing incidence X-ray diffraction
    Watanabe, Takeshi
    Koganezawa, Tomoyuki
    Kikuchi, Mamoru
    Videlot-Ackermann, Christine
    Ackermann, Joerg
    Brisset, Hugues
    Hirosawa, Ichiro
    Yoshimoto, Noriyuki
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2014, 53 (01)
  • [4] Grazing-incidence x-ray diffraction study of pentacene thin films with the bulk phase structure
    Yoshida, Hiroyuki
    Sato, Naoki
    APPLIED PHYSICS LETTERS, 2006, 89 (10)
  • [5] INDEXING GRAZING INCIDENCE X-RAY DIFFRACTION PATTERNS OF THIN FILMS
    Simbrunner, Josef
    Hofer, Sebastian
    Schrode, Benedikt
    Salzmann, Ingo
    Resel, Roland
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2019, 75 : E715 - E715
  • [6] Grazing incidence synchrotron X-ray diffraction study of crystal orientation in microporous films
    Mintova, S
    Metzger, TH
    Bein, T
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2003, 200 : 160 - 164
  • [7] Grazing-incidence X-ray diffraction study of rubrene epitaxial thin films
    Fumagalli, Enrico
    Campione, Marcello
    Raimondo, Luisa
    Sassella, Adele
    Moret, Massimo
    Barba, Luisa
    Arrighetti, Gianmichele
    JOURNAL OF SYNCHROTRON RADIATION, 2012, 19 : 682 - 687
  • [8] Crystal structure in the near-surface region of melt-crystallized polyethylene films evaluated by grazing-incidence X-ray diffraction.
    Sasaki, S
    Yakabe, H
    Sakata, O
    Takahara, A
    Kajiyama, T
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2003, 226 : U511 - U511
  • [9] Depth profiling of thin ITO films by grazing incidence X-ray diffraction
    Neerinck, DG
    Vink, TJ
    THIN SOLID FILMS, 1996, 278 (1-2) : 12 - 17
  • [10] Thickness determination of thin polycrystalline films by grazing incidence X-ray diffraction
    Lhotka, J
    Kuzel, R
    Cappuccio, G
    Valvoda, V
    EUROPEAN POWDER DIFFRACTION EPDIC 8, 2004, 443-4 : 115 - 118
12345