Reply to comments on "crystallography and migration mechanisms of planar interphase boundaries"

被引：10
|
作者：
Nie, JF [1 ]
机构：
[1] Monash Univ, Sch Phys & Mat Engn, Clayton, Vic 3800, Australia
来源：
SCRIPTA MATERIALIA | 2005年 / 52卷 / 07期
关键词：
phase transformations; crystallography; invariant line; lattice matching;
D O I：
10.1016/j.scriptamat.2004.11.032
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
In this short note it is demonstrated that the approach reported recently by the author can give crystallographic predictions that are consistent with experimental observations, even though the definition for shear strain in this approach is different from that traditionally used for matrix calculations and thus in the invariant line approach. The relationship between Moire plane interfaces and invariant lines is further discussed. (C) 2004 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码：687 / 691
页数：5
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