New capabilities of the Zagreb ion microbeam system

被引：95

作者：

Jaksic, M. ^{[1
]}

Radovic, I. Bogdanovc ^{[1
]}

Bogovac, M. ^{[1
]}

Desnica, V. ^{[1
]}

Fazinic, S. ^{[1
]}

Karlusic, M. ^{[1
]}

Medunic, Z. ^{[1
]}

Muto, H. ^{[1
]}

Pastuovic, Z. ^{[1
]}

Siketic, Z. ^{[1
]}

Skukan, N. ^{[1
]}

Tadic, T. ^{[1
]}

机构：

[1] Rudjer Boskovic Inst, Zagreb 10002, Croatia

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2007年 / 260卷 / 01期

关键词：

heavy ions; data acquisition; tandem accelerator; nuclear microprobe;

D O I：

10.1016/j.nimb.2007.01.252

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The installation of a new 1.0 MV Tandetron accelerator and a recent upgrade of the 6.0 MV Tandem Van de Graaff accelerator increased the application possibilities of the Zagreb ion microbeam, system. Several ion sources enable now the selection of a wide variety of ions. Most of them can be focused by the existing microprobe system. Sample positioning tools and new scanner control options are implemented in the new generation of SPECTOR data acquisition system. Details of the upgrades are presented. (c) 2007 Elsevier B.V. All rights reserved.

引用

页码：114 / 118

页数：5

共 7 条

[1] Radiation damage microstructures in silicon and application in position sensitive charged particle detection [J].