Stability, local structure and electronic properties of borane radicals on the Si(100) 2 x 1:H surface: A first-principles study

被引:4
|
作者
Fang, C. M. [1 ,2 ]
Mohammadi, V. [2 ]
Nihtianov, S. [2 ]
Sluiter, M. H. F. [3 ]
机构
[1] Brunel Univ London, BCAST, Waterside House,Cowley Business Pk, Uxbridge UB8 2AD, Middx, England
[2] Delft Univ Technol, Fac Elect Engn Math & Comp Sci, Elect Instrumentat Lab, Mekelweg 4, NL-2628 CD Delft, Netherlands
[3] Delft Univ Technol, Dept Mat Sci & Engn, Mekelweg 2, NL-2628 CD Delft, Netherlands
基金
英国工程与自然科学研究理事会;
关键词
Borane deposition; H passivated Si(001) surface; PureB process; Ab initio calculations; CHEMICAL-VAPOR-DEPOSITION; ELASTIC BAND METHOD; BORON FILMS; PYROLYSIS; DECOMPOSITION; KINETICS; POINTS; GAS;
D O I
10.1016/j.commatsci.2017.08.036
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Deposition of a thin B layer via decomposition of B2H6 on Si (PureB process) produces B-Si junctions which exhibit unique electronic and optical properties. Here we present the results of our systematic first-principles study of BHn (n = 0-3) radicals on Si(1 0 0)2 x 1:H surfaces, the initial stage of the PureB process. The calculations reveal an unexpectedly high stability of BH2 and BH3 radicals on the surface and a plausible atomic exchange mechanism of surface Si atoms with B atoms from absorbed BHn radicals. The calculations show strong local structural relaxation and reconstructions, as well as strong chemical bonding between the surface Si and the BHn radicals. Electronic structure calculations show various defect states in the energy gap of Si due to the BHn absorption. These results shed light on the initial stages of the complicated PureB process and also rationalize the unusual electronic, optical and electrical properties of the deposited Si surfaces. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码:253 / 260
页数:8
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