Spatial sampling of printed patterns

被引:23
作者
Sarker, P [1 ]
Nagy, G
Zhou, JY
Lopresti, D
机构
[1] Rensselaer Polytech Inst, Dept Elect Comp & Syst Engn, Troy, NY 12180 USA
[2] Panason Technol Inc, Panason Informat & Networking Technol Lab, Princeton, NJ 08540 USA
[3] Lucent Technol, Bell Labs Res, Murray Hill, NJ 07974 USA
关键词
spatial sampling; random phase sampling; digitization; optical character recognition; document defect models; scanner models; modulo-grid diagram; locales;
D O I
10.1109/34.667892
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
The bitmap obtained by scanning a printed pattern depends on the exact location of the scanning grid relative to the pattern. We consider ideal sampling with a regular lattice of delta functions. The displacement of the lattice relative to the pattern is random and obeys a uniform probability density function defined over a unit cell of the lattice. Random-phase sampling affects the edge-pixels of sampled patterns. The resulting number of distinct bitmaps and their relative frequencies can be predicted from a mapping of the original pattern boundary to the unit cell (called a module-grid diagram). The theory is supported by both simulated and experimental results. The module-grid diagram may be useful in helping to understand the effects of edge-pixel variation on Optical Character Recognition.
引用
收藏
页码:344 / 351
页数:8
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