Trapping of highly charged ions with an electrostatic ion trap

被引：1

作者：

Gumberidze, A. ^{[1
]}

Attia, D. ^{[1
]}

Szabo, C. I. ^{[1
]}

Indelicato, P. ^{[1
]}

Vallette, A. ^{[1
]}

Carmo, S. ^{[2
]}

机构：

[1] Univ Paris 06, ENS, CNRS, Lab Kastler Brossel, F-75252 Paris 05, France

[2] Univ Coimbra, Dept Phys, P-3000 Coimbra, Portugal

来源：

14TH INTERNATIONAL CONFERENCE ON THE PHYSICS OF HIGHLY CHARGED IONS (HCI 2008) | 2009年 / 163卷

关键词：

LIFETIME MEASUREMENT;

D O I：

10.1088/1742-6596/163/1/012110

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

In the current contribution, we present our first results with an electrostatic ion trap which has been constructed at LKB (Laboratoire Kastler Brossel) in collaboration with the Weizmann institute. The electrostatic ion trap is composed of two coaxial electrostatic mirrors, working for charged particles in the same way as a Fabry-Perot interferometer works for light in the optical regime. The trap has been attached to the beamline of SIMPA (Source d'ions Multichargs de Paxis) an Electron Cyclotron Resonance Ion Source (ECRIS) at LKB (Laboratoire Kastler Brossel) and INSP (Institut des NanoSciences de Paxis). The trap is foreseen to be applied for various studies on highly charged ions; as measurements of the life times of metastable states, mass spectroscopy etc. First results for trapping highly-charged ions axe presented and simulations in order to explain the observed behavior are discussed.

引用

页数：4

共 7 条

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