Moisture and temperature effects on the reliability of interfacial adhesion of a polymer/metal interface

被引:26
作者
Ferguson, TP [1 ]
Qu, JM [1 ]
机构
[1] Georgia Inst Technol, George W Woodruff Sch Mech Engn, Atlanta, GA 30332 USA
来源
54TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS | 2004年
关键词
D O I
10.1109/ECTC.2004.1320355
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Although moisture can considerably alter the mechanical performance and the overall reliability of microelectronic assemblies, the interfacial and material constitutive damage behavior from moisture is not entirely understood. In this paper, the effect of moisture content on the interfacial adhesion of an epoxy based underfill adhesive with a copper alloy substrate is studied. Test specimens were divided into five test groups and subjected to four different levels of moisture preconditioning. The test groups included fully dry, 85degreesC only, 85degreesC/50%RH, 85degreesC/65%RH, and 85degreesC/85%RH, with the latter four test groups being exposed for a duration of 168 hours. Underfill flexural bend test specimens were used to measure the change in the underfill elastic modulus as a function of increasing moisture concentration, while underfill / copper bilayer test specimens with prefabricated interface cracks were used to measure the critical load of fracture of the interface as a function of interfacial moisture content. Both the critical load of fracture and underfill elastic modulus values were used to determine the interfacial fracture toughness of the underfill / copper interface for a particular level of moisture preconditioning. After fracture testing, the chemical composition of the interface was evaluated using Xray Photoelectron Spectroscopy (XPS) to identify the role of oxide growth on the interfacial fracture toughness results. The results of this study provide the intrinsic behavior of the interfacial toughness as a function of increasing moisture concentration, and include the effects of oxidation, thermal aging, and elastic modulus variation with increasing moisture content after moisture preconditioning.
引用
收藏
页码:1752 / 1758
页数:7
相关论文
共 31 条
[1]  
*ASTM, 1999, D790 ASTM
[2]   Effect of the microstructure of copper oxide on the adhesion behavior of epoxy/copper leadframe joints [J].
Cho, KW ;
Cho, EC .
JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 2000, 14 (11) :1333-1353
[3]   Adhesion measurement for electronic packaging applications using double cantilever beam method [J].
Dai, X ;
Brillhart, MV ;
Ho, PS .
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2000, 23 (01) :101-116
[4]   Study on underfill/solder adhesion in flip-chip encapsulation [J].
Fan, LH ;
Tison, CK ;
Wong, CP .
IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2002, 25 (04) :473-480
[5]   Effect of moisture on the interfacial adhesion of the underfill/solder mask interface [J].
Ferguson, T ;
Qu, JM .
JOURNAL OF ELECTRONIC PACKAGING, 2002, 124 (02) :106-110
[6]  
FERGUSON T, 2003, IEEE T COMPONENTS PA
[7]   EFFECTS OF OXIDATION AND SURFACE-ROUGHNESS ON CONTACT-ANGLE [J].
HONG, KT ;
IMADOJEMU, H ;
WEBB, RL .
EXPERIMENTAL THERMAL AND FLUID SCIENCE, 1994, 8 (04) :279-285
[8]   MIXED-MODE CRACKING IN LAYERED MATERIALS [J].
HUTCHINSON, JW ;
SUO, Z .
ADVANCES IN APPLIED MECHANICS, VOL 29, 1992, 29 :63-191
[9]   Interface adhesion between copper lead frame and epoxy moulding compound: Effects of surface finish, oxidation and dimples [J].
Kim, JK ;
Lebbai, M ;
Liu, JH ;
Kim, JH ;
Yuen, MMF .
50TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE - 2000 PROCEEDINGS, 2000, :601-608
[10]   Microstructure, adhesion strength and failure path at a polymer/roughened metal interface [J].
Lee, HY ;
Qu, JM .
JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 2003, 17 (02) :195-215