Numerical simulation of critical current and n-value in Nb3Sn strand subjected to bending strain

被引:19
作者
Murakami, Haruyuki [1 ]
Ishiyama, Atsushi
Ueda, Hiroshi
Koizumi, Norikiyo
Okuno, Kiyoshi
机构
[1] Waseda Univ, Dept Elect Engn & Biosci, Tokyo 1698555, Japan
[2] Japan Atom Energy Agcy, Ibaraki 3110193, Japan
关键词
bending load; CICC; critical current; current transfer; degradation; Nb3Sn strand; numerical simulation;
D O I
10.1109/TASC.2007.898113
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Critical current of ITER model coil degraded with the increase of electromagnetic force. Analysis based on results of the experiments in which periodic transverse load is artificially applied to single strand showed that periodic bending of the strand by transverse load caused this degradation. However, since the experiments were carried out under a certain condition, general relation between transverse load and critical current was not obtained. We have therefore developed a numerical simulation code to investigate the general relation. However, there were some disagreements between the simulation and experimental results in our previous study. Our simulation model was consequently modified, resulting in good agreement with the test results. The general dependence of the critical current on periodic transverse load, temperature, and pitch of periodic load is investigated using the modified simulation code. The simulation results reveal that the reduced critical current depends on the temperature, and is a function of the bending strain independent of the pitch of the periodic load.
引用
收藏
页码:1394 / 1397
页数:4
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