Embedded at-speed test probe

被引：0

作者：

Aigner, M ^{[1
]}

机构：

[1] Tektronix Inc, Integrated Instruments Grp, Beaverton, OR 97077 USA

来源：

ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY | 1997年

关键词：

D O I：

10.1109/TEST.1997.639708

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The addition of a small Analog Probe circuit to an ASIC design allows previously unreachable internal signal nodes of the ASIC to be accurately monitored and measured with conventional test equipment. The Probe is essentially a high-performance analog multiplexer, that can connect to up to 16 test points inside the core of the ASIC with minimal loading, and buffer these signals accurately to a transmission line driver output connected to a dedicated pad, A 0.65u CMOS implementation of the Probe circuit provides a -3dB bandwidth in excess of 400 MHz.

引用

页码：932 / 937

页数：6