How Do Detected Objects Affect the Noise Distribution of Terahertz Security Images?

被引:13
作者
Wang, Zhaodi [1 ]
Hu, Menghan [1 ,2 ]
Kuruoglu, Ercan Engin [3 ]
Zhu, Wenhan [1 ]
Zhai, Guangtao [1 ]
机构
[1] Shanghai Jiao Tong Univ, Inst Image Commun & Informat Proc, Shanghai 200240, Peoples R China
[2] East China Normal Univ, Shanghai Key Lab Multidimens Informat Proc, Shanghai 200241, Peoples R China
[3] CNR, Natl Council Res Italy, Inst Sci & Technol Informat A Faedo, I-56124 Pisa, Italy
基金
美国国家科学基金会; 中国博士后科学基金;
关键词
THz image; noise pattern; noise estimation; statistical analysis; alpha-stable distribution;
D O I
10.1109/ACCESS.2018.2859359
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
The purpose of this paper is to analyze how detected objects affect the noise distribution of terahertz (THz) security images. Noise in THz image caused by hardware deteriorates the image quality seriously, limiting the application. In addition, there are a few papers on the noise analysis of THz screenings. Due to the special attributes of the THz image compared with the natural image, an alpha-stable distribution is used to fit the noise of THz image instead of the commonly-used Gaussian distribution. The database used in this paper is composed of 181 THz image cubes with a test object as well as two empty image cubes. After analyzing the four parameters of alpha-stable distribution, we can observe that the noise patterns of THz images are indeed different from those of natural image obtained by RGB camera. The possible reasons are given based on the principles of the THz imaging device. The analysis of the distribution of four parameters of alpha-stable model demonstrates that there exists a nonlinear effect due to the change of reflected wave's pattern caused by the body structure. This paper provides an efficient and flexible model for THz images and a useful guidance for the design of THz image denoising algorithms and the development of imaging hardware.
引用
收藏
页码:41087 / 41092
页数:6
相关论文
共 25 条
[1]  
Ahi K., 2016, P SOC PHOTO-OPT INS, V9856
[2]   Quality control and authentication of packaged integrated circuits using enhanced-spatial-resolution terahertz time-domain spectroscopy and imaging [J].
Ahi, Kiarash ;
Shahbazmohamadi, Sina ;
Asadizanjani, Navid .
OPTICS AND LASERS IN ENGINEERING, 2018, 104 :274-284
[3]   Mathematical Modeling of THz Point Spread Function and Simulation of THz Imaging Systems [J].
Ahi, Kiarash .
IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY, 2017, 7 (06) :747-754
[4]   ADVANCED TEHERTZ TECHNIQUES FOR QUALITY CONTROL AND COUNTERFEIT DETECTION [J].
Ahi, Kiarash ;
Anwar, Mehdi .
TERAHERTZ PHYSICS, DEVICES, AND SYSTEMS X: ADVANCED APPLICATIONS IN INDUSTRY AND DEFENSE, 2016, 9856
[5]   Terahertz Characterization of Electronic Components and Comparison of Terahertz Imaging with X-ray Imaging Techniques [J].
Ahi, Kiarash ;
Asadizanjani, Navid ;
Shahbazmohamadi, Sina ;
Tehranipoor, Mark ;
Anwar, Mehdi .
TERAHERTZ PHYSICS, DEVICES, AND SYSTEMS IX: ADVANCED APPLICATIONS IN INDUSTRY AND DEFENSE, 2015, 9483
[6]  
[Anonymous], 2012, TERAHERTZ TECHNIQUES
[7]  
[Anonymous], 2006, Digital Image Processing
[8]  
Arce G.R., 2005, Nonlinear signal processing: a statistical approach
[9]   Tasking on Natural Statistics of Infrared Images [J].
Goodall, Todd Richard ;
Bovik, Alan Conrad ;
Paulter, Nicholas G., Jr. .
IEEE TRANSACTIONS ON IMAGE PROCESSING, 2016, 25 (01) :65-79
[10]  
Hou L., 2014, P INT C INFR MILL TH, P1