Kuijk Bandgap Voltage Reference With High Immunity to EMI

被引：22

作者：

Redoute, Jean-Michel ^{[1
]}

Steyaert, Michiel ^{[1
]}

机构：

[1] Katholieke Univ Leuven, Dept Elect Engn ESAT, Microelect & Sensors Div MICAS, B-3001 Heverlee, Belgium

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS | 2010年 / 57卷 / 02期

关键词：

Bandgap voltage references; electromagnetic compatibility; electromagnetic interference; SUPPLY-VOLTAGE; SUSCEPTIBILITY;

D O I：

10.1109/TCSII.2009.2037991

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This brief evaluates the effect of conducted electromagnetic interference (EMI) that is injected in the power supply of a classic Kuijk bandgap reference voltage circuit. Two modified Kuijk bandgap topologies with high immunity to EMI are introduced and compared to the original structure. Measurements of a test IC confirm the theoretical analyses.

引用

页码：75 / 79

页数：5

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