Deformation characteristics of Au wire bonding

被引:10
作者
Saiki, Hiroyuki [1 ]
Nishitake, Hiroshi [1 ]
Yotsumoto, Takahiro [1 ]
Marumo, Yasuo [1 ]
机构
[1] Kumamoto Univ, Dept Mech Syst Engn, Kumamoto 8608555, Japan
关键词
wire bonding; bondability; deformation pattern; integrated circuits;
D O I
10.1016/j.jmatprotec.2007.03.037
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In wire bonding, the quality of the bonding between the Al film and the Au wire has an effect on productivity and reliability. It is required to reduce the bonding area to as small as possible without deteriorating the level of bondability to increase the level of integration. The effect of capillary tip shape on bonding was investigated by deformation analysis of the Au ball by the rigid-plastic finite element method and by experiments. The flow stress of Au wire for the numerical analysis was evaluated by conducting the tensile test of Au wire at an ambient temperature of 250 degrees C. The mean radii and the amount of sliding for the bonded areas were evaluated with respect to the radius of the compression-bonded ball as a parameter under three conditions of capillary tip angle theta:theta = 45 degrees, 60 degrees and 30 degrees. Bonding can be achieved when the amount of sliding is 0.01 -0.05 mu m or greater. With decreasing the capillary tip angle 0, the amount of sliding tends to increase. The amount of sliding can be controlled by changing the tip shape of the capillary. The results of deformation analysis and experiments on An ball deformation indicate that the evaluation of the relationship between the shape of the capillary and bondability can be carried out by rigid-plastic FEM. This method used here is effective for determining the optimum bonding conditions and the proper shape of capillaries. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:16 / 19
页数:4
相关论文
共 50 条
  • [21] Wire Sweep Characterization in System-in-Package (SiP) Component with Au Wire Bonding During Epoxy Molding Compounds Molding Process
    Myung, Woo-Ram
    Bang, Jae-Oh
    Ha, Sang-Su
    Kim, Dae Up
    Jung, Seung-Boo
    NANOSCIENCE AND NANOTECHNOLOGY LETTERS, 2015, 7 (12) : 994 - 998
  • [22] Comparison of Insulated with Bare Au Bonding Wire: HAZ Length, HAZ Breaking Force, and FAB Deformability
    Wan Ho Song
    Chunjin Hang
    Andrew Pequegnat
    Michael Mayer
    Norman Y. Zhou
    Young-Kyu Song
    John Persic
    Journal of Electronic Materials, 2009, 38 : 834 - 842
  • [23] Comparison of Insulated with Bare Au Bonding Wire: HAZ Length, HAZ Breaking Force, and FAB Deformability
    Song, Wan Ho
    Hang, Chunjin
    Pequegnat, Andrew
    Mayer, Michael
    Zhou, Norman Y.
    Song, Young-Kyu
    Persic, John
    JOURNAL OF ELECTRONIC MATERIALS, 2009, 38 (06) : 834 - 842
  • [24] Some thoughts on bondability and strength of gold wire bonding
    Zulkifli, Muhammad Nubli
    Abdullah, Shahrum
    Othman, Norinsan Kamil
    Jalar, Azman
    GOLD BULLETIN, 2012, 45 (03): : 115 - 125
  • [25] Some thoughts on bondability and strength of gold wire bonding
    Muhammad Nubli Zulkifli
    Shahrum Abdullah
    Norinsan Kamil Othman
    Azman Jalar
    Gold Bulletin, 2012, 45 : 115 - 125
  • [26] Research on 0.6 mil Ag-8Au-3Pd Alloy Wire Bonding Process
    Yin, Cheng
    Guo, Rui
    Li, Ming
    Xiao, Jason
    Lv, Eric
    Chiu, Hope
    2013 14TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2013, : 200 - +
  • [27] Finite Element analysis of wire clamp for wire bonding
    Fan, Dengke
    Wang, Fuliang
    2012 13TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2012), 2012, : 954 - 957
  • [28] Wire bonding using Pd plated Cu wire
    Spansion Japan Limited, Final Manufacturing Operations R and D, 1-14 Nisshin-cho, Kawasaki-ku, Kawasaki-shi, Kanagawa 210-0024, Japan
    J. Jpn. Inst. Electron. Packag., 2008, 6 (444-450): : 444 - 450
  • [29] Two capillary solutions for ultra-fine-pitch wire bonding and insulated wire bonding
    Goh, K. S.
    Zhong, Z. W.
    MICROELECTRONIC ENGINEERING, 2007, 84 (02) : 362 - 367
  • [30] Power chip interconnection: From wire bonding to area bonding
    Liu, XS
    Lu, GQ
    2000 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, 2000, 4339 : 264 - 269