Critical current degradation Behavior in YBCO coated conductors under torsional strain

被引:32
|
作者
Shin, Hyung-Seop [1 ]
Dizon, John Ryan C.
Kim, Tae-Hyung
Ha, Dong-Woo
Oh, Sang-Soo
机构
[1] Andong Natl Univ, Sch Mech Engn, Andong 760749, Kyungbuk, South Korea
[2] Andong Natl Univ, Grad Sch, Dept Mech Engn, Andong 760749, Kyungbuk, South Korea
[3] Korea Electrotechnol Res Inst, Appl Superconduct Res Grp, Chang Won 641120, Kyungnam, South Korea
关键词
coated conductor; critical current; torsional strain; YBCO;
D O I
10.1109/TASC.2007.897458
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The I-c degradation behaviors of a YBCO coated conductor (CC) tape (RABiTS/MOD) was investigated using a sample holder which gives torsional angles to HTS tapes. The I-c degradation in YBCO CC tape under torsional strains occurred gradually which is a characteristic feature under torsion. Uniform torsional deformation was induced in the YBCO CC tape evident from the consistent I-c degradation behavior at each subsection along the longitudinal direction of the tape. Similar with the tension case, the reversible behavior of I-c under torsional loading was found. The irreversible strain, epsilon(irr.t.), was similar to.6%. The critical strain defined by the 95% I-c retention criterion was 1.4% which was located within the irreversible limit. The n-value-theta behavior in the YBCO CC tape was similar to the I-c/I-c0-theta behavior.
引用
收藏
页码:3274 / 3277
页数:4
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