Characterization of nanocrystalline materials by X-ray line profile analysis

被引：168
|
作者：
Ungar, Tamas [1 ]
机构：
[1] Eotvos Lorand Univ, Dept Phys Mat, H-1088 Budapest, Hungary
来源：
JOURNAL OF MATERIALS SCIENCE | 2007年 / 42卷 / 05期
基金：
匈牙利科学研究基金会;
关键词：
D O I：
10.1007/s10853-006-0696-1
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
X-ray line profile analysis is shown to be a powerful tool to characterize the microstructure of nanocrystalline materials in terms of grain and subgrain size, dislocation structure and dislocation densities and planar defects, especially stacking faults and twin boundaries. It is shown that the X-ray method can provide valuable complementary information about the microstructure, especially when combined with transmission electron microscopy and differential scanning calorimetry.
引用
收藏
页码：1584 / 1593
页数：10
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