CMOS compatible low-power volatile atomic switch for steep-slope FET devices

被引:9
作者
Lim, Seokjae [1 ]
Yoo, Jongmyung [1 ]
Song, Jeonghwan [1 ]
Woo, Jiyong [2 ]
Park, Jaehyuk [1 ]
Hwang, Hyunsang [1 ]
机构
[1] Pohang Univ Sci & Technol POSTECH, Dept Mat Sci & Engn, 77 Cheongam Ro, Pohang 37673, South Korea
[2] Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85281 USA
关键词
CMOS integrated circuits;
D O I
10.1063/1.5039898
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this paper, we demonstrate a volatile atomic switch that can be utilized for obtaining steep subthreshold swing (SS) (<5 mV/dec) characteristics in FETs. We propose a CMOS-compatible atomic switch (W/Cu2S/W) that demonstrates volatility and immunity to the voltage-time dilemma. Furthermore, we enhance the device characteristics by examining the composition control, scaling of device size, and film thickness. Then, the atomic switch is integrated with a conventional transistor that has a large SS (>60 mV/dec). The result shows an improvement in the SS, which results from the transition of the atomic switch between the ON and OFF states, which is caused by the formation and rupture of a conductive filament. As a result, excellent switching characteristics are obtained for the FETs, such as low I-OFF (similar to 10(-5) mu A/mu m), high I-NO/I-OFF ratio (similar to 10(-5)), low V-DD (similar to 0.25 V), and steep SS (<5 mV/dec). Published by AIP Publishing.
引用
收藏
页数:4
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