Design and Optimization of In-Plane Actuator Driven Cantilever with High Sensitivity Sensors

被引:2
作者
Chen, Xing
Lee, Dong-Weon [1 ]
机构
[1] Chonnam Natl Univ, MEMS, Sch Mech Syst Engn, Kwangju 500757, South Korea
关键词
Cantilever; Big Deflection; Actuation Method; SCANNING PROBE MICROSCOPY; SWITCHABLE CANTILEVER; FORCE MICROSCOPE; FABRICATION; NITRIDE; SYSTEM;
D O I
10.1166/jnn.2010.2257
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We present a new mode of actuation and excitation for cantilevers, which endows cantilevers with large deflection for the specific application. Differing from all of the conventional methods in which the deflection is aroused by the vertical drive of cantilever itself or external vibration, the bending and oscillating actuation here is by means of the in-plane actuators, where the out-of-plane motion of the cantilever is driven by the actuation of integrated in-plane actuators combined with curl-shaped cantilever. Because the driving force of the horizontal actuator can be converted through curl-shaped cantilever into a bending moment that results in cantilever deflection, out-of-plane actuation source for cantilever deflection is independent of the cantilever itself. An in-plane electrostatic actuator with comb-drive structures that has two sets of fixed fingers and one set of moving fingers was introduced for both statically bending and dynamically oscillating the cantilever. The optimal structure was obtained through an analytical model and finite element simulation; it achieves a substantially greater deflection and a concentrated stress distribution located on the hinges, in which the integrated piezoresistive sensors are embedded to suffer from larger stress for high sensitive sensing.
引用
收藏
页码:3236 / 3240
页数:5
相关论文
共 12 条
[1]   High efficiency micromachining system applied in nanolithography [J].
Chen, Xing ;
Lee, Dong Weon ;
Choi, Young Soo .
INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2008, 22 (9-11) :1865-1870
[2]   Integrated microactuation scanning probe microscopy system [J].
Chen, Xing ;
Lee, Dong-Weon .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2009, 27 (03) :1408-1412
[3]   Resonator combined with a piezoelectric actuator for chemical analysis by force microscopy [J].
Kawai, Yusuke ;
Ono, Takahito ;
Esashi, Masayoshi ;
Meyer, Ernst ;
Gerber, Christoph .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (06)
[4]   A smart microfour-point probe with ultrasharp in-plane tips [J].
Kim, Ji-Kwan ;
Zhang, Yan ;
Lee, Dong-Weon .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2009, 80 (04)
[5]   Switchable cantilever for a time-of-flight scanning force microscope [J].
Lee, D ;
Wetzel, A ;
Bennewitz, R ;
Meyer, E ;
Despont, M ;
Vettiger, P ;
Gerber, C .
APPLIED PHYSICS LETTERS, 2004, 84 (09) :1558-1560
[6]   Switchable cantilever fabrication for a novel time-of-flight scanning force microscope [J].
Lee, DW ;
Despont, M ;
Drechsler, U ;
Gerber, C ;
Vettiger, P ;
Wetzel, A ;
Bennewitz, R ;
Meyer, E .
MICROELECTRONIC ENGINEERING, 2003, 67-8 :635-643
[7]  
LEE DW, 2005, J MICROMECH MICROENG, V15, P1
[8]   Quality factor of micro cantilevers transduced by piezoelectric lead zirconate titanate film [J].
Lu, Jian ;
Ikehara, Tsuyoshi ;
Kobayashi, Takeshi ;
Maeda, Ryutaro ;
Mihara, Takashi .
MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2007, 13 (11-12) :1517-1522
[9]   Scanning probe microscopy - Probing the future [J].
Miles, M .
SCIENCE, 1997, 277 (5333) :1845-&
[10]   Nanomechanical resonant structures in silicon nitride: fabrication, operation and dissipation issues [J].
Sekaric, L ;
Carr, DW ;
Evoy, S ;
Parpia, JM ;
Craighead, HG .
SENSORS AND ACTUATORS A-PHYSICAL, 2002, 101 (1-2) :215-219