Self-biased dielectric bolometer from epitaxially grown Pb(Zr,Ti)O3 and lanthanum-doped Pb(Zr,Ti)O3 multilayered thin films

被引:25
作者
Liu, WG [1 ]
Jiang, B [1 ]
Zhu, WG [1 ]
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Ctr Microelect, Singapore 639798, Singapore
关键词
D O I
10.1063/1.1289064
中图分类号
O59 [应用物理学];
学科分类号
摘要
A self-biased dielectric bolometer has been realized by epitaxially grown lead zirconate titanate Pb-1.1(Zr0.3Ti0.7)O-3 (PZT 30/70) and lanthanum-doped lead zirconate titanate Pb0.83La0.17(Zr0.3Ti0.7)(0.9575)O-3 (PLZT 17/30/70) multilayered thin films using the sol-gel technique. The high-resolution transmission electron microscopy images and electron diffraction pattern showed that the multilayered film had its preferred (111) orientation and the epitaxial growth between the PZT 30/70 and PLZT 17/30/70 layers. The self-biased phenomenon and a large pyroelectric current were observed in the prepoled sample without any external bias at the PLZT 17/30/70 phase transition temperature of 120 degrees C. Pyroelectric coefficient as high as 990 mu C/m(2)K is obtained in the multilayer thin films around 120 degrees C. It is obvious that there exists an induced polarization in the PLZT 17/30/70 layer. We attribute this self-biased effect to the strong remnant polarization in the immediately contacted tetragonal PZT 30/70 layers. (C) 2000 American Institute of Physics. [S0003-6951(00)04333-3].
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页码:1047 / 1049
页数:3
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