Crystallization of calcium hexaluminate on basal alumina

被引：18

作者：

Mallamaci, MP ^{[1
]}

Sartain, KB ^{[1
]}

Carter, CB ^{[1
]}

机构：

[1] Univ Minnesota, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1998年 / 77卷 / 03期

关键词：

D O I：

10.1080/01418619808224069

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The epitactic growth of calcium hexaluminate (CA(6)) on the basal plane of alumina was observed during an investigation of the interaction between silicate glass films deposited on single-crystal alumina (alpha-Al2O3). Two distinctly different orientation relationships occurred. The first can be described as perfect hexagon-on-hexagon epitaxy with (11 (2) over bar 0)(CA6)parallel to(10 (1) over bar 0)(Al2O3) and (0001)(Al2O3)parallel to(0001)(CA6). This relationship has 1.1% lattice misfit in the substrate plane; the misfit is accommodated at the interface by a hexagonal network of misfit dislocations. In the second relationship the CA(6) grains are rotated about the substrate normal and can be explained by the coincident-site lattice model for phase boundaries. Both orientation relationships emphasize the influence of substrate crystallography on the crystallization process.

引用

页码：561 / 575

页数：15

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