Contrast transfer functions for Zernike phase contrast in full-field transmission hard X-ray microscopy

被引：5

作者：

Yang, Yang ^{[1
,2
]}

Cheng, Yin ^{[1
]}

Heine, Ruth ^{[1
]}

Baumbach, Tilo ^{[1
,3
]}

机构：

[1] Karlsruhe Inst Technol, Inst Photon Sci & Synchrotron Radiat IPS, D-76344 Eggenstein Leopoldshafen, Germany

[2] European Synchrotron Radiat Facil, BP 220, F-38043 Grenoble, France

[3] Karlsruhe Inst Technol, Lab Applicat Synchrotron Radiat LAS, D-76131 Karlsruhe, Germany

来源：

OPTICS EXPRESS | 2016年 / 24卷 / 06期

关键词：

SYNCHROTRON-RADIATION; ELECTRON-MICROSCOPY; SPATIAL-RESOLUTION; TOMOGRAPHY; RETRIEVAL; DIFFRACTION; NM;

D O I：

10.1364/OE.24.006063

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Full-field transmission hard X-ray microscopy (TXM) has been widely applied to study morphology and structures with high spatial precision and to dynamic processes. Zernike phase contrast (ZPC) in hard X-ray TXM is often utilized to get an in-line phase contrast enhancement for weak-absorbing materials with little contrast differences. Here, following forward image formation, we derive and simplify the contrast transfer functions (CTFs) of the Zernike phase imaging system in TXM based on a linear space-shift-invariant imaging mode under certain approximations. The CTFs in ZPC in their simplified forms show a high similarity to the one in free-space propagation X-ray imaging systems. (C) 2016 Optical Society of America

引用

页码：6063 / 6070

页数：8

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