Contrast transfer functions for Zernike phase contrast in full-field transmission hard X-ray microscopy

被引：5
|
作者：
Yang, Yang [1 ,2 ]
Cheng, Yin [1 ]
Heine, Ruth [1 ]
Baumbach, Tilo [1 ,3 ]
机构：
[1] Karlsruhe Inst Technol, Inst Photon Sci & Synchrotron Radiat IPS, D-76344 Eggenstein Leopoldshafen, Germany
[2] European Synchrotron Radiat Facil, BP 220, F-38043 Grenoble, France
[3] Karlsruhe Inst Technol, Lab Applicat Synchrotron Radiat LAS, D-76131 Karlsruhe, Germany
来源：
OPTICS EXPRESS | 2016年 / 24卷 / 06期
关键词：
SYNCHROTRON-RADIATION; ELECTRON-MICROSCOPY; SPATIAL-RESOLUTION; TOMOGRAPHY; RETRIEVAL; DIFFRACTION; NM;
D O I：
10.1364/OE.24.006063
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Full-field transmission hard X-ray microscopy (TXM) has been widely applied to study morphology and structures with high spatial precision and to dynamic processes. Zernike phase contrast (ZPC) in hard X-ray TXM is often utilized to get an in-line phase contrast enhancement for weak-absorbing materials with little contrast differences. Here, following forward image formation, we derive and simplify the contrast transfer functions (CTFs) of the Zernike phase imaging system in TXM based on a linear space-shift-invariant imaging mode under certain approximations. The CTFs in ZPC in their simplified forms show a high similarity to the one in free-space propagation X-ray imaging systems. (C) 2016 Optical Society of America
引用
收藏
页码：6063 / 6070
页数：8
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