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Silicon-based metal-semiconductor-metal detectors
被引:5
作者
:
Buchal, C
论文数:
0
引用数:
0
h-index:
0
机构:
Forschungszentrum Julich, ISI, IT, D-52425 Julich, Germany
Forschungszentrum Julich, ISI, IT, D-52425 Julich, Germany
Buchal, C
[
1
]
Loken, M
论文数:
0
引用数:
0
h-index:
0
机构:
Forschungszentrum Julich, ISI, IT, D-52425 Julich, Germany
Forschungszentrum Julich, ISI, IT, D-52425 Julich, Germany
Loken, M
[
1
]
机构
:
[1]
Forschungszentrum Julich, ISI, IT, D-52425 Julich, Germany
来源
:
MRS BULLETIN
|
1998年
/ 23卷
/ 04期
关键词
:
D O I
:
10.1557/S088376940003027X
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
[No abstract available]
引用
收藏
页码:55 / 59
页数:5
相关论文
共 25 条
[21]
SIEGERT M, UNPUB
[22]
Sze S., 1990, HIGH SPEED SEMICONDU
[23]
SZE SM, 1981, PHYSICS SEMICONDUCTO
[24]
COMPARISON OF THE PICOSECOND CHARACTERISTICS OF SILICON AND SILICON-ON-SAPPHIRE METAL-SEMICONDUCTOR-METAL PHOTODIODES
WANG, CC
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ROCHESTER,DEPT ELECT ENGN,ROCHESTER,NY 14623
UNIV ROCHESTER,DEPT ELECT ENGN,ROCHESTER,NY 14623
WANG, CC
ALEXANDROU, S
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ROCHESTER,DEPT ELECT ENGN,ROCHESTER,NY 14623
UNIV ROCHESTER,DEPT ELECT ENGN,ROCHESTER,NY 14623
ALEXANDROU, S
JACOBSPERKINS, D
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ROCHESTER,DEPT ELECT ENGN,ROCHESTER,NY 14623
UNIV ROCHESTER,DEPT ELECT ENGN,ROCHESTER,NY 14623
JACOBSPERKINS, D
HSIANG, TY
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ROCHESTER,DEPT ELECT ENGN,ROCHESTER,NY 14623
UNIV ROCHESTER,DEPT ELECT ENGN,ROCHESTER,NY 14623
HSIANG, TY
[J].
APPLIED PHYSICS LETTERS,
1994,
64
(26)
: 3578
-
3580
[25]
SI/SIGE HETEROSTRUCTURES AND DEVICES
ZHOU, GL
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
ZHOU, GL
MORKOC, H
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
MORKOC, H
[J].
THIN SOLID FILMS,
1993,
231
(1-2)
: 125
-
142
←
1
2
3
→
共 25 条
[21]
SIEGERT M, UNPUB
[22]
Sze S., 1990, HIGH SPEED SEMICONDU
[23]
SZE SM, 1981, PHYSICS SEMICONDUCTO
[24]
COMPARISON OF THE PICOSECOND CHARACTERISTICS OF SILICON AND SILICON-ON-SAPPHIRE METAL-SEMICONDUCTOR-METAL PHOTODIODES
WANG, CC
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ROCHESTER,DEPT ELECT ENGN,ROCHESTER,NY 14623
UNIV ROCHESTER,DEPT ELECT ENGN,ROCHESTER,NY 14623
WANG, CC
ALEXANDROU, S
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ROCHESTER,DEPT ELECT ENGN,ROCHESTER,NY 14623
UNIV ROCHESTER,DEPT ELECT ENGN,ROCHESTER,NY 14623
ALEXANDROU, S
JACOBSPERKINS, D
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ROCHESTER,DEPT ELECT ENGN,ROCHESTER,NY 14623
UNIV ROCHESTER,DEPT ELECT ENGN,ROCHESTER,NY 14623
JACOBSPERKINS, D
HSIANG, TY
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ROCHESTER,DEPT ELECT ENGN,ROCHESTER,NY 14623
UNIV ROCHESTER,DEPT ELECT ENGN,ROCHESTER,NY 14623
HSIANG, TY
[J].
APPLIED PHYSICS LETTERS,
1994,
64
(26)
: 3578
-
3580
[25]
SI/SIGE HETEROSTRUCTURES AND DEVICES
ZHOU, GL
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
ZHOU, GL
MORKOC, H
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
UNIV ILLINOIS,COORDINATED SCI LAB,URBANA,IL 61801
MORKOC, H
[J].
THIN SOLID FILMS,
1993,
231
(1-2)
: 125
-
142
←
1
2
3
→