Detection of scintillation light in liquid xenon by multipixel avalanche Geiger photodiode and wavelength shifter

被引：9

作者：

Akimov, D. Yu. ^{[1
]}

Akindinov, A. V. ^{[1
]}

Alexandrov, I. S. ^{[1
]}

Burenkov, A. A. ^{[1
]}

Danilov, M. V. ^{[1
]}

Yablokov, M. Yu. ^{[2
]}

Kovalenko, A. G. ^{[1
]}

Stekhanov, V. N. ^{[1
]}

Surin, N. M. ^{[2
]}

Zav'yalov, S. A. ^{[3
]}

机构：

[1] Inst Theoret & Expt Phys, State Sci Ctr Russian Federat, Moscow 117218, Russia

[2] Russian Acad Sci, Enikolopov Inst Synthet Polymer Mat, Moscow 117393, Russia

[3] Karpov Inst Phys Chem, State Sci Ctr Russian Federat, Moscow 105064, Russia

来源：

JOURNAL OF INSTRUMENTATION | 2010年 / 5卷

关键词：

Photon detectors for UV; visible and IR photons (solid-state) (PIN diodes; APDs; Si-PMTs; CCDs; EBCCDs etc); Noble-liquid detectors (scintillation; ionization two-phase); Cryogenic detectors; GASEOUS XENON;

D O I：

10.1088/1748-0221/5/04/P04007

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A multipixel avalanche Geiger photodiode with a p-terphenyl wavelength shifter in front of it has been tested in the liquid xenon to detect the 175-nm scintillation light. The detection efficiency of about 10% is obtained. A poly-para-xylylene film was used for protection of the liquid xenon detection medium from p-terphenyl pollution. The film has shown very good and stable adhesion at the low temperatures both to the p-terphenyl surface and to the surface of the stainless steel flange.

引用

页数：10

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