Note on 'construction of double sampling s-control charts for agile manufacturing'

被引：9

作者：

Hsu, Lie-Fern ^{[1
]}

机构：

[1] CUNY Bernard M Baruch Coll, Dept Management, New York, NY 10010 USA

来源：

QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL | 2007年 / 23卷 / 02期

关键词：

statistical quality control; double-sampling s charts; agile manufacturing; genetic algorithm;

D O I：

10.1002/qre.776

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

He and Grigoryan (Quality and Reliability Engineering International 2002; 18:343-355) formulated the design of a double-sampling (DS) s control chart as an optimization problem and solved it with a genetic algorithm. They concluded that the DS s control charts can be a more economically preferable alternative in detecting small shifts than traditional s control charts. We explain that, since they only considered the average sample size when the process is in control, their conclusion is questionable. Copyright (C) 2006 John Wiley & Sons, Ltd.

引用

页码：269 / 272

页数：4

共 3 条

[1] Construction of double sampling s-control charts for agile manufacturing
He, D
Grigoryan, A
QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 2002, 18 (04) : 343 - 355
[2] Double sampling hotelling's T2 charts
Champ, Charles W.
Aparisi, Francisco
QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 2008, 24 (02) : 153 - 166
[3] Joint statistical design of double sampling (X)over-bar and s charts
He, D
Grigoryan, A
EUROPEAN JOURNAL OF OPERATIONAL RESEARCH, 2006, 168 (01) : 122 - 142

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