Behavior of Ag and ZnO Thin Films, Deposited by Thermal Evaporation Technique, as an Optical Filter

被引：0

作者：

Dwivedi, V. K. ^{[1
]}

Misra, K. P. ^{[1
]}

Srivastava, Atul ^{[1
]}

Shukla, R. K. ^{[1
]}

Srivastava, Anchal ^{[1
]}

机构：

[1] Univ Lucknow, Dept Phys, Lucknow 226007, Uttar Pradesh, India

来源：

2ND NATIONAL WORKSHOP ON ADVANCED OPTOELECTRONIC MATERIALS AND DEVICES (AOMD-2008) | 2008年

关键词：

Ag; ZnO; Transmittance; Interference Filter;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Interference filters are multilayer thin-film devices in which thin layers of material have a thickness of the order of wavelength of light. Thin films of dielectrics as well as metals have been nice candidates for the purpose of interference filters for a long time. In the present paper thin films of silver and zinc oxide have been deposited by thermal evaporation technique on the glass substrate. The optical transmittance of these films as well as combinations of these films has been investigated thoroughly in the visible and near infrared region.

引用

页码：295 / 298

页数：4

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