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CaTiO3:Eu3+, a potential red long lasting phosphor: Energy migration and characterization of trap level distribution
被引:41
|作者:
Som, S.
[1
]
Dutta, S.
[2
]
Kumar, Vijay
[1
]
Pandey, Anurag
[1
]
Kumar, Vinod
[1
]
Kunti, A. K.
[2
]
Priya, J.
[2
]
Sharma, S. K.
[2
]
Terblans, J. J.
[1
]
Swart, H. C.
[1
]
机构:
[1] Univ Free State, Dept Phys, ZA-9300 Bloemfontein, South Africa
[2] Indian Sch Mines, Dept Appl Phys, Dhanbad 826004, Bihar, India
基金:
新加坡国家研究基金会;
关键词:
CaTiO3:Eu3+;
Long afterglow;
Defect levels;
TL;
Phosphorescence;
PERSISTENT LUMINESCENCE;
PHOTOLUMINESCENCE;
ENHANCEMENT;
NANOPHOSPHOR;
FABRICATION;
IMPROVEMENT;
CATIO3PR3+;
AFTERGLOW;
NETWORKS;
EU2+;
D O I:
10.1016/j.jallcom.2014.11.001
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
This paper comprises a promising approach for the development of a red-light emitting CaTiO3:Eu3+ long-lasting phosphor. Eu3+ doped CaTiO3 phosphors were prepared by the solid state reaction method at 1000 degrees C. Red long-afterglow (LAG) originated from the f-f transitions of Eu3+ in the CaTiO3 and lasted for several minutes. Defect trap depth values from 0.62 up to 1.21 eV were obtained from thermoluminescence (TL) data. These defects were created due to charge compensation. These traps were responsible for the afterglow emission at room temperature. The decay curves and TL glow curves showed that the density of the traps with suitable depth has been significantly changed with an increase in dopant concentration. The depth and density of the traps can affect the LAG performance. The possible mechanism behind the LAG of Eu3+ in CaTiO3 was explained in detail on the basis of the trap distribution. (C) 2014 Elsevier B.V. All rights reserved.
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页码:1068 / 1073
页数:6
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