Economic allocation of reliability growth testing using Weibull distributions

被引:27
作者
Awad, Mahmoud [1 ]
机构
[1] Amer Univ Sharjah, Dept Ind Engn, POB 26666, Sharjah, U Arab Emirates
关键词
Reliability growth testing Duane; Repairable systems; SYSTEMS; MODELS;
D O I
10.1016/j.ress.2016.03.012
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Reliability growth testing (RGT) has been widely used for assessing the reliability of complex systems in many industries such as automotive, aerospace, and oil and gas industry. The traditional common and practiced approach of RGT is to assess the initial reliability of the system by building and testing few prototypes for a period of time that extends from few months to years. Then, based on the initial reliability, initial testing time, and reliability target; the total testing time is determined using power law based models such as Duane and AMSAA/Crow models. In this paper, a new method is proposed to allocate RGT time for both subsystems and system level in order to minimize system failure intensity under limited cost and time resources. Unlike existing methods, failure intensity is assumed to be dynamic and modeled using Weibull distribution. Modeling using Weibull is more realistic and increases the applicability of the proposed method in real life applications. The proposed method is motivated by real life examples and its effectiveness is demonstrated by real-life examples. (C) 2016 Elsevier Ltd. All rights reserved.
引用
收藏
页码:273 / 280
页数:8
相关论文
共 28 条
[1]   An approach to software reliability prediction based on time series modeling [J].
Amin, Ayman ;
Grunske, Lars ;
Colman, Alan .
JOURNAL OF SYSTEMS AND SOFTWARE, 2013, 86 (07) :1923-1932
[2]   Economic allocation of test times for subsystem-level reliability growth testing [J].
Coit, DW .
IIE TRANSACTIONS, 1998, 30 (12) :1143-1151
[3]  
Coolen F, 2008, WILEY ENCY STAT QUAL
[4]  
Crow L, 2014, P ANN REL MAINT S RA
[5]   Optimal Weighted Combinational Models for Software Reliability Estimation and Analysis [J].
Hsu, Chao-Jung ;
Huang, Chin-Yu .
IEEE TRANSACTIONS ON RELIABILITY, 2014, 63 (03) :731-749
[6]   Reliability Demonstration for Long-Life Products Based on Degradation Testing and a Wiener Process Model [J].
Jin, Guang ;
Matthews, David .
IEEE TRANSACTIONS ON RELIABILITY, 2014, 63 (03) :781-797
[7]   A simple procedure for Bayesian estimation of the Weibull distribution [J].
Kaminskiy, MP ;
Krivtsov, VV .
IEEE TRANSACTIONS ON RELIABILITY, 2005, 54 (04) :612-616
[8]  
Krasich M, 2014, P ANN REL MAINT S RA
[9]  
Lasdon L.S., 1978, ACM T MATH SOFTWARE, V1, P33
[10]  
Li ZJ, 2015, IEEE T RELIAB, V65, P1