Structural Properties of Rubrene Thin Films Grown on Mica Surfaces

被引：1

作者：

Djuric, T. ^{[1
]}

Flesch, H. -G. ^{[1
]}

Koini, M. ^{[1
]}

Al-Baqi, Sh. M. Abd ^{[2
]}

Sitter, H. ^{[2
]}

Resel, R. ^{[1
]}

机构：

[1] Graz Univ Technol, Inst Solid States Phys, A-8010 Graz, Austria

[2] Univ Linz, Inst Solid State & Semicond Phys, Linz, Austria

来源：

INTERFACE CONTROLLED ORGANIC THIN FILMS | 2009年 / 129卷

关键词：

D O I：

10.1007/978-3-540-95930-4_8

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Structural properties of rubrene thin films on cleaved mica (001) surfaces were investigated by optical microscopy and x-ray diffraction. Optical microscopy shows, that the crystallization of rubrene results in formation of spherulites. X-ray specular diffraction reveals polycrystalline and polymorphic nature of rubrene. The pole figure measurements of films prepared at low deposition rates reveal orthorhombic structure and indicate fiber textures with crystallographic planes (121), (131) and (141) preferentially oriented parallel to the substrate surface. High deposition rate thin films in addition show polymorphism, corroborating the existence of the orthorhombic and the triclinic phase.

引用

页码：49 / 53

页数：5

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