Distance-dependent plasma composition and ion energy in high power impulse magnetron sputtering

被引:27
作者
Ehiasarian, Arutiun P. [1 ]
Andersson, Joakim [2 ,3 ]
Anders, Andre [2 ]
机构
[1] Sheffield Hallam Univ, Mat & Engn Res Inst, Sheffield S1 1WB, S Yorkshire, England
[2] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Berkeley, CA 94720 USA
[3] Uppsala Univ, Angstrom Lab, Uppsala, Sweden
基金
英国工程与自然科学研究理事会;
关键词
THIN-FILMS; COATINGS;
D O I
10.1088/0022-3727/43/27/275204
中图分类号
O59 [应用物理学];
学科分类号
摘要
The plasma composition of high power impulse magnetron sputtering (HIPIMS) has been studied for titanium and chromium targets using a combined energy analyser and quadrupole mass spectrometer. Measurements were done at distances from 50 to 300 mm from the sputtering target. Ti and Cr are similar in atomic mass but have significantly different sputter yields, which gives interesting clues on the effect of the target on plasma generation and transport of atoms. The Ti and Cr HIPIMS plasmas operated at a peak target current density of similar to 0.5 A cm(-2). The measurements of the argon and metal ion content as well as the ion energy distribution functions showed that (1) singly and doubly charged ions were found for argon as well as for the target metal, (2) the majority of ions were singly charged argon for both metals at all distances investigated, (3) the Cr ion density was maintained to distances further from the target than Ti. Gas rarefaction was identified as a main factor promoting transport of metal ions, with the stronger effect observed for Cr, the material with higher sputter yield. Cr ions were found to displace a significant portion of the gas ions, whereas this was less evident in the Ti case. The observations indicate that the presence of metal vapour promotes charge exchange and reduces the electron temperature and thereby practically prevents the production of Ar2+ ions near the target. The content of higher charge states of metal ions depends on the probability of charge exchange with argon.
引用
收藏
页数:8
相关论文
共 24 条
  • [1] Phase tailoring of Ta thin films by highly ionized pulsed magnetron sputtering
    Alami, J.
    Eklund, P.
    Andersson, J. M.
    Lattemann, M.
    Wallin, E.
    Bohlmark, J.
    Persson, P.
    Helmersson, U.
    [J]. THIN SOLID FILMS, 2007, 515 (7-8) : 3434 - 3438
  • [2] High power impulse magnetron sputtering: Current-voltage-time characteristics indicate the onset of sustained self-sputtering
    Anders, Andre
    Andersson, Joakim
    Ehiasarian, Arutiun
    [J]. JOURNAL OF APPLIED PHYSICS, 2007, 102 (11)
  • [3] Anders A, 2008, SPRINGER SER ATOM OP, V50, P1, DOI 10.1007/978-0-387-79108-1_1
  • [4] High power impulse magnetron sputtering: Current-voltage-time characteristics indicate the onset of sustained self-sputtering (vol 102, art no 113303, 2007)
    Andersa, Andre
    Andersson, Joakim
    Ehiasarian, Arutiun
    [J]. JOURNAL OF APPLIED PHYSICS, 2008, 103 (03)
  • [5] [Anonymous], SOC VAC COAT 52 ANN
  • [6] Behrisch R., 1981, Sputtering by Particle Bombardment, V1
  • [7] A comprehensive model of stress generation and relief processes in thin films deposited with energetic ions
    Bilek, MMM
    McKenzie, DR
    [J]. SURFACE & COATINGS TECHNOLOGY, 2006, 200 (14-15) : 4345 - 4354
  • [8] Study of the transport of titanium neutrals and ions in the post-discharge of a high power pulsed magnetron sputtering device
    de Poucques, Ludovic
    Imbert, Jean-Christophe
    Boisse-Laporte, Caroline
    Bretagne, Jean
    Ganciu, Mihai
    Teule-Gay, Lionel
    Touzeau, Michel
    [J]. PLASMA SOURCES SCIENCE & TECHNOLOGY, 2006, 15 (04) : 661 - 669
  • [9] Ion composition produced by high power impulse magnetron sputtering discharges near the substrate
    Ehiasarian, A. P.
    Vetushka, A.
    Hecimovic, A.
    Konstantinidis, S.
    [J]. JOURNAL OF APPLIED PHYSICS, 2008, 104 (08)
  • [10] Comparison of microstructure and mechanical properties of chromium nitride-based coatings deposited by high power impulse magnetron sputtering and by the combined steered cathodic arc/unbalanced magnetron technique
    Ehiasarian, AP
    Hovsepian, PE
    Hultman, L
    Helmersson, U
    [J]. THIN SOLID FILMS, 2004, 457 (02) : 270 - 277