Structural effects in electrical conductivity of SnO2 thin films

被引：0
|
作者：
Ivashchenko, A [1 ]
Kerner, I [1 ]
机构：
[1] Moldavian Acad Sci, Inst Phys Appl, Kishinev 2028, Moldova
来源：
CAS '97 PROCEEDINGS - 1997 INTERNATIONAL SEMICONDUCTOR CONFERENCE, 20TH EDITION, VOLS 1 AND 2 | 1997年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Electrical conductivity in SnO2 thin films is studied within the framework of percolation theory. To improve the agreement between experiment and theory the effect of film microstructure was taken into account by chose the uniform function for energy distribution of intergrain barrier heights.
引用
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页码：451 / 454
页数：4
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